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Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor | C. Barry Carter | |
dc.contributor.author | David B. Williams | |
dc.date.accessioned | 2022-07-11T02:25:03Z | - |
dc.date.available | 2022-07-11T02:25:03Z | - |
dc.date.issued | 2009 | |
dc.identifier.uri | http://elib.hcmussh.edu.vn/handle/HCMUSSH/34523 | - |
dc.format.extent | 804 p. | |
dc.language | eng | |
dc.publisher | Springer | |
dc.subject | Materials -- Microscopy | - |
dc.subject | Transmission electron microscopy | - |
dc.subject | Kính hiển vi | - |
dc.subject | Kính hiển vi điện tử | - |
dc.subject | Vật liệu | - |
dc.subject.ddc | 502.8 | |
dc.title | Transmission electron microscopy : a textbook for materials science | |
dc.description.version | 2nd ed. | |
Appears in Collections | Sách tham khảo |
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