Item Infomation
Full metadata record
| DC Field | Value | Language |
|---|---|---|
| dc.contributor | Paul De Boeck | |
| dc.contributor.author | Tom Verguts | |
| dc.date.accessioned | 2022-07-13T19:53:52Z | - |
| dc.date.available | 2022-07-13T19:53:52Z | - |
| dc.identifier.citation | Applied Psychological Measurement. - 2000. - Vol. 24, no. 2 (Jun, 2000). - p. 151 - 162 | |
| dc.identifier.uri | http://elib.hcmussh.edu.vn/handle/HCMUSSH/73610 | - |
| dc.format.extent | 13 tr. | |
| dc.language | eng | |
| dc.title | A rasch model for detecting learning while solving an intelligence test | |
| Appears in Collections | Bài trích | |
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