Item Infomation
Full metadata record
| DC Field | Value | Language |
|---|---|---|
| dc.contributor | Lynda M. Reese | |
| dc.contributor.author | Wim J. Van Der Linden | |
| dc.date.accessioned | 2022-07-13T19:58:07Z | - |
| dc.date.available | 2022-07-13T19:58:07Z | - |
| dc.identifier.citation | Applied Psychological Measurement. - 1998. - Vol. 22, no. 3 (Sep, 1998). - p. 259 - 270 | |
| dc.identifier.uri | http://elib.hcmussh.edu.vn/handle/HCMUSSH/73686 | - |
| dc.format.extent | 13 tr. | |
| dc.language | eng | |
| dc.title | A Model for Optimal Constrained Adaptive Testing | |
| Appears in Collections | Bài trích | |
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